Microstructures of the interlayer in Mo/Si multilayers induced by proton irradiation

In this work, the microstructure and optical properties of the Mo/Si multilayers mirror for the space extreme-ultraviolet solar telescope before and after 100 keV proton irradiation have been investigated. EUV/soft X-ray reflectometer (EXRR) results showed that, after proton irradiation, the reflect...

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Published inScience China. Physics, mechanics & astronomy Vol. 55; no. 11; pp. 2194 - 2198
Main Authors Lv, Peng, Wang, XiaoDong, Liu, Hai, Zhang, ZaiQiang, Guan, JinTong, Chen, Bo, Guan, QingFeng
Format Journal Article
LanguageEnglish
Published Heidelberg SP Science China Press 01.11.2012
Springer Nature B.V
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Summary:In this work, the microstructure and optical properties of the Mo/Si multilayers mirror for the space extreme-ultraviolet solar telescope before and after 100 keV proton irradiation have been investigated. EUV/soft X-ray reflectometer (EXRR) results showed that, after proton irradiation, the reflectivity of the Mo/Si multilayer decreased from 12.20% to 8.34% and the center wavelength revealed red shift of 0.38 nm, as compared with those before proton irradiation. High-resolution transmission electron microscopy (HRTEM) observations revealed the presence of MoSi2, Mo3Si and Mo5Si3 in Mo-on-Si interlayers before irradiation. The preferred orientation such as MoSi2 with (101) texture and Mo5Si3 with (310) texture was formed in Mo-on-Si interlayers after proton irradiation, which led to the increase of thickness in the interlayers. It is suggested that the changes of microstructures in Mo/Si multilayers under proton irradiation could cause optical properties degradation.
Bibliography:11-5000/N
multilayer ; microstructure ; irradiation damage ; optical properties
In this work, the microstructure and optical properties of the Mo/Si multilayers mirror for the space extreme-ultraviolet solar telescope before and after 100 keV proton irradiation have been investigated. EUV/soft X-ray reflectometer (EXRR) results showed that, after proton irradiation, the reflectivity of the Mo/Si multilayer decreased from 12.20% to 8.34% and the center wavelength revealed red shift of 0.38 nm, as compared with those before proton irradiation. High-resolution transmission electron microscopy (HRTEM) observations revealed the presence of MoSi2, Mo3Si and Mo5Si3 in Mo-on-Si interlayers before irradiation. The preferred orientation such as MoSi2 with (101) texture and Mo5Si3 with (310) texture was formed in Mo-on-Si interlayers after proton irradiation, which led to the increase of thickness in the interlayers. It is suggested that the changes of microstructures in Mo/Si multilayers under proton irradiation could cause optical properties degradation.
LV Peng, WANG XiaoDong, LIU Hai, ZHANG ZaiQiang, GUAN JinTong, CHEN Bo, GUAN QingFeng(1 School of Materials Science & Engineering, Jiangsu University, Zhenjiang 212013, China; 2 State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China; 3 Space Materials and Environment Engineering Laboratory, Harbin Institute of Technology, Harbin 150001, China; 4 Faculty of Science, Jiangsu University, Zhenjiang 212013, China)
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1674-7348
1869-1927
DOI:10.1007/s11433-012-4908-1