Ordered arrangement of irradiation-induced defects of polycrystalline tungsten irradiated with low-energy hydrogen ions

Low-energy (20–520eV) hydrogen ion irradiations were performed at W surface temperature of 373–1073K and a fluence ranging from 5.0×1023 to 1.0×1025/m2. Conductive atomic force microscopy (CAFM) as a nondestructive analytical technique was successfully used to detect irradiation-induced defects in p...

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Bibliographic Details
Published inJournal of nuclear materials Vol. 464; pp. 216 - 220
Main Authors Ni, Weiyuan, Yang, Qi, Fan, Hongyu, Liu, Lu, Berthold, Tobias, Benstetter, Günther, Liu, Dongping
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.09.2015
Subjects
Crystal defects
Crystal lattices
Density
Fluence
Hydrogen ions
Low energy
Nanostructure
Ripples
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Summary:Low-energy (20–520eV) hydrogen ion irradiations were performed at W surface temperature of 373–1073K and a fluence ranging from 5.0×1023 to 1.0×1025/m2. Conductive atomic force microscopy (CAFM) as a nondestructive analytical technique was successfully used to detect irradiation-induced defects in polycrystalline W. The size and density of these nanometer-sized defects were strongly dependent on the fluence of hydrogen ions. Both ion energy (E) and temperature (T) play a crucial role in determining the ordering of nanometer-sized defects. Ordered arrangements were formed at relatively high E and T. This can be attributed to the stress-driven ripple effect of defect growth at crystal grains, resulting in the movement of W lattice along one certain crystal planes.
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content type line 23
ISSN:0022-3115
1873-4820
DOI:10.1016/j.jnucmat.2015.04.045