Single-walled carbon nanotube (SWNT)-carboxymethylcellulose (CMC) dispersions in aqueous solution and electronic transport properties when dried as thin film conductors

Obtaining uniformly dispersed SWNT within an aqueous mixture for subsequent use as a dried coating in electronic biosensors is a challenge. The objective of this study is to relate SWNT dispersion conditions to resultant dried film properties. Aqueous solutions of SWNT dispersed with CMC (a dispersi...

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Bibliographic Details
Published inJournal of dispersion science and technology Vol. 39; no. 11; pp. 1613 - 1626
Main Authors Young, B. R., Aminayi, P.
Format Journal Article
LanguageEnglish
Published Philadelphia Taylor & Francis 02.11.2018
Taylor & Francis Ltd
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Summary:Obtaining uniformly dispersed SWNT within an aqueous mixture for subsequent use as a dried coating in electronic biosensors is a challenge. The objective of this study is to relate SWNT dispersion conditions to resultant dried film properties. Aqueous solutions of SWNT dispersed with CMC (a dispersing agent with unique properties compatible with biomolecules) at different SWNT:CMC weight ratios and at different sonication conditions were studied. Solution particle size distribution data was obtained using dynamic light scattering. Differently formulated/processed SWNT/CMC solutions were used to form dry thin, conductive films. The resistance of each film was measured and its resistivity calculated. Response Surface Methodology (RSM) design of experiments (DOE) analysis was used as the tool to fit the data to establish a model and identify trends for the parameters studied. Profilometry was used to examine film surface uniformity. 3D optical microscopy was used to investigate film morphology and determine film thickness, and to relate these data back to solution dispersion conditions and dried film resistances. The lowest dried film resistivity (0.012 ohm-cm) was obtained at the highest levels of parameters studied in the DOE. Smaller solution particle size resulted in lower dried film surface roughness and better film uniformity.
ISSN:0193-2691
1532-2351
DOI:10.1080/01932691.2018.1452759