Adaptive phase field modeling of grain boundary diffusion

• Published in: Journal of crystal growth Vol. 318; no. 1; pp. 46 - 50
• Main Authors: Yeh, S.Y., Chen, C.C., Lan, C.W.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.03.2011; Elsevier
• Subjects: A1. Phase field model; A1. Solidification; Alloys; B1. Grain boundary diffusion; B1. Polycrystalline alloy; Computer simulation; Cross-disciplinary physics: materials science; rheology; Crystal growth; Dealing; Diffusion; Exact sciences and technology; Grain boundary diffusion; Materials science; Phase diagrams and microstructures developed by solidification and solid-solid phase transformations; Physics; Solidification; B1. Grain boundary diffusion; A1. Solidification; A1. Phase field model; B1. Polycrystalline alloy; Phase field model; Digital simulation; Polycrystals; Phase field method; Solidification; Interfaces; Grain boundary diffusion; Morphology; Diffusion process
• ISSN: 0022-0248; 1873-5002
• DOI: 10.1016/j.jcrysgro.2010.10.091

The phase field modeling (PFM) has emerged as a powerful tool for the simulation of the solidification of polycrystalline alloys. The use of the diffusive interface in PFM allows the treatment of the complicated morphology. However, in dealing with the grain boundary diffusion, it is difficult to simulate the diffusion process that is independent of the interface thickness. To amend this, we propose a model that imbeds a grain boundary diffusion term in the existing adaptive phase field model. In this new model, the simulated solute transport is independent of the interface thickness, and the simulated grain boundary diffusion is in good agreement with the classic solution.