Annealing effect on the photoluminescence characteristics of ZnO-nanowires and the improved optoelectronic characteristics of p-NiO/n-ZnO nanowire UV detectors

• Published in: Japanese Journal of Applied Physics Vol. 54; no. 6S1; pp. 6 - 10
• Main Authors: Li, Yu-Ren, Wan, Chung-Yun, Chang, Chia-Tsung, Huang, Yu-Chin, Tsai, Wan-Lin, Chou, Chia-Hsin, Wang, Kuang-Yu, Cheng, Huang-Chung
• Format: Journal Article
• Language: English
• Published: The Japan Society of Applied Physics 01.06.2015
• ISSN: 0021-4922; 1347-4065
• DOI: 10.7567/JJAP.54.06FG05

Transparent ultraviolet (UV) detectors with nanoheterojunctions (NHJs) of p-type NiO and n-type ZnO nanowires (ZnO-NWs) were successfully fabricated using a DC sputtering system and a hydrothermal process, respectively. After annealing in nitrogen ambient, the near-band-edge emission to deep level emission ratio (NBE/DLE) of ZnO-NWs gradually increased as the temperature increased and reached a maximum of 28.9 at a temperature setting of 500 °C. In contrast, after annealing in oxygen atmosphere, the NBE/DLE of ZnO-NWs initially increased from 1.2 to 5.9 and then decreased to 3.2. At a reverse bias of 2 V, the devices with the 500-°C-N2-annealed ZnO-NWs exhibited better sensitivity (JUV/JDark = 5.65; JVisible/JDark = 1.35) to UV light (365 nm, 0.3 mW/cm2) than those with the as-grown ZnO-NWs (JUV/JDark = 4.98; JVisible/JDark = 3.82) because the structural defects in ZnO-NWs were effectively eliminated after annealing in nitrogen ambient at 500 °C.