A model for charge transfer inverse photoemission

Charge transfer inverse photoemission spectroscopy (CTRIPS), the phenomenon of inverse photoemission at a metal–solution interface, has been the subject of a variety of experiments. An approximate theoretical model is presented which includes (1) the electronic structure of the metal; (2) the princi...

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Published inElectrochimica acta Vol. 49; no. 1; pp. 3 - 21
Main Authors Gosavi, Shachi, Marcus, R.A.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Oxford Elsevier Ltd 30.12.2003
Elsevier
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Abstract Charge transfer inverse photoemission spectroscopy (CTRIPS), the phenomenon of inverse photoemission at a metal–solution interface, has been the subject of a variety of experiments. An approximate theoretical model is presented which includes (1) the electronic structure of the metal; (2) the principal features of the emission spectra, such as the high and low frequency thresholds at a given injection energy of the electron or hole, and the intensity of the light emission versus electrode potential; (3) the role of surface states; and (4) the question of direct versus indirect radiative transitions. A broad array of experiments from different groups is surveyed and treated. There is a considerable need for experiments to fill many missing “gaps” in the data, and various experiments are suggested.
AbstractList Charge transfer inverse photoemission spectroscopy (CTRIPS), the phenomenon of inverse photoemission at a metal–solution interface, has been the subject of a variety of experiments. An approximate theoretical model is presented which includes (1) the electronic structure of the metal; (2) the principal features of the emission spectra, such as the high and low frequency thresholds at a given injection energy of the electron or hole, and the intensity of the light emission versus electrode potential; (3) the role of surface states; and (4) the question of direct versus indirect radiative transitions. A broad array of experiments from different groups is surveyed and treated. There is a considerable need for experiments to fill many missing “gaps” in the data, and various experiments are suggested.
Charge transfer inverse photoemission spectroscopy (CTRIPS), the phenomenon of inverse photoemission at a metal-solution interface, has been the subject of a variety of experiments. An approximate theoretical model is presented which includes (1) the electronic structure of the metal; (2) the principal features of the emission spectra, such as the high and low frequency thresholds at a given injection energy of the electron or hole, and the intensity of the light emission versus electrode potential; (3) the role of surface states; and (4) the question of direct versus indirect radiative transitions. A broad array of experiments from different groups is surveyed and treated. There is a considerable need for experiments to fill many missing 'gaps' in the data, and various experiments are suggested. [Materials include Au and Pt.]
Author Gosavi, Shachi
Marcus, R.A.
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Issue 1
Keywords CTRIPS
Pt
Au
Theory
Charge transfer inverse photoemission
Electrode photoemission
Metal-solution photoemission
Electron injection
Surface electron state
Theoretical study
Electrode electrolyte interface
Transition metal
Crystal face
Inverse photoemission
Transport process
Electronic structure
Crystal electrode
Numerical simulation
Charge transfer
Photoelectrode
Electrode potential
Language English
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Snippet Charge transfer inverse photoemission spectroscopy (CTRIPS), the phenomenon of inverse photoemission at a metal–solution interface, has been the subject of a...
Charge transfer inverse photoemission spectroscopy (CTRIPS), the phenomenon of inverse photoemission at a metal-solution interface, has been the subject of a...
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SubjectTerms Charge transfer inverse photoemission
Chemistry
CTRIPS
Electrochemistry
Electrode photoemission
Exact sciences and technology
General and physical chemistry
Metal-solution photoemission
Study of interfaces
Theory
Transport phenomena
Title A model for charge transfer inverse photoemission
URI https://dx.doi.org/10.1016/j.electacta.2003.07.007
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