A model for charge transfer inverse photoemission

Charge transfer inverse photoemission spectroscopy (CTRIPS), the phenomenon of inverse photoemission at a metal–solution interface, has been the subject of a variety of experiments. An approximate theoretical model is presented which includes (1) the electronic structure of the metal; (2) the princi...

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Bibliographic Details
Published inElectrochimica acta Vol. 49; no. 1; pp. 3 - 21
Main Authors Gosavi, Shachi, Marcus, R.A.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Oxford Elsevier Ltd 30.12.2003
Elsevier
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Summary:Charge transfer inverse photoemission spectroscopy (CTRIPS), the phenomenon of inverse photoemission at a metal–solution interface, has been the subject of a variety of experiments. An approximate theoretical model is presented which includes (1) the electronic structure of the metal; (2) the principal features of the emission spectra, such as the high and low frequency thresholds at a given injection energy of the electron or hole, and the intensity of the light emission versus electrode potential; (3) the role of surface states; and (4) the question of direct versus indirect radiative transitions. A broad array of experiments from different groups is surveyed and treated. There is a considerable need for experiments to fill many missing “gaps” in the data, and various experiments are suggested.
Bibliography:SourceType-Scholarly Journals-2
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ISSN:0013-4686
1873-3859
DOI:10.1016/j.electacta.2003.07.007