An optical hydrogen sensor based on a Pd-capped Mg thin film wedge

We report the proof of concept of a thin film device with a one-to-one relationship between the H 2 partial pressure and the lateral progression of a visible optical change along a thin film multilayer 70 mm long. The device basically consists of a sensing Mg layer with a thickness gradient. It expl...

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Bibliographic Details
Published inInternational journal of hydrogen energy Vol. 35; no. 22; pp. 12574 - 12578
Main Authors Palmisano, V., Filippi, M., Baldi, A., Slaman, M., Schreuders, H., Dam, B.
Format Journal Article
LanguageEnglish
Published Kidlington Elsevier Ltd 01.11.2010
Elsevier
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Summary:We report the proof of concept of a thin film device with a one-to-one relationship between the H 2 partial pressure and the lateral progression of a visible optical change along a thin film multilayer 70 mm long. The device basically consists of a sensing Mg layer with a thickness gradient. It exploits the thickness dependence of the hydrogenation thermodynamics of Pd-capped Mg thin films. The optical change of the Mg layer during the metal–hydride transition can be detected both in reflection and in transmission. This optical sensor allows a continuous measurement of hydrogen partial pressure in the range between 200 and 4000 Pa.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0360-3199
1879-3487
DOI:10.1016/j.ijhydene.2010.09.001