Evaluation of electrical contact area between metal and semiconductor using photo-induced current

Photo-induced current (PIC) is produced from excited electrons and holes in a semiconductor by irradiation of laser light. Since the intensity of the PIC depends on the traveling distance of carriers, measuring current between a metal and a semiconductor can be utilized for analyzing electrical cont...

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Bibliographic Details
Published inTribology international Vol. 41; no. 1; pp. 44 - 48
Main Authors Kotake, S., Sakurada, H., Suzuki, T., Suzuki, Y.
Format Journal Article
LanguageEnglish
Published Oxford Elsevier Ltd 2008
Elsevier
Subjects
Applied sciences
Distribution map
Electrical contact
Exact sciences and technology
Friction, wear, lubrication
Machine components
Mechanical engineering. Machine design
Tunneling current
Distribution map
Tunneling current
Electrical contact
Semiconductor materials
Mechanical contact
Electric contact
Laser irradiation
Metal
Contact surface
Contact stress
Laser
Contact pressure
Tribology
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Summary:Photo-induced current (PIC) is produced from excited electrons and holes in a semiconductor by irradiation of laser light. Since the intensity of the PIC depends on the traveling distance of carriers, measuring current between a metal and a semiconductor can be utilized for analyzing electrical contact. The spatial resolution of the PIC depends on the attenuated length and the thickness of the semiconductor, and its intensity is proportional to the contact pressure. By scanning laser light, we obtained two-dimensional distribution maps of electrical contacts between solids.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0301-679X
1879-2464
DOI:10.1016/j.triboint.2007.04.005