Topography of Thin Teflon Layers and Induced Orientation of Nematic Liquid Crystals

It has recently been shown that teflon (PTFE) films can be used as orientation layers to align liquid crystal molecules. In this paper we study the influence of the deposition parameters (pressure, speed and temperature) on the layer morphology given by both optical and atomic force microscopy. In a...

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Published inMolecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals Vol. 333; no. 1; pp. 181 - 191
Main Authors Cuminal, Marie-Pierre, Touhari, Françoise, Brunet, Monique, Cohen-Solal, Gerard
Format Journal Article
LanguageEnglish
Published Philadelphia, PA Taylor & Francis Group 01.08.1999
Gordon and Breach
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Summary:It has recently been shown that teflon (PTFE) films can be used as orientation layers to align liquid crystal molecules. In this paper we study the influence of the deposition parameters (pressure, speed and temperature) on the layer morphology given by both optical and atomic force microscopy. In addition, we have measured the surface pretilt angle induced on nematics by these films. It turns out that teflon gives a small pretilt, of the order of 0.3 degrees, at the surface. Although the topography of the deposited layer is seen to vary, the characteristic nematic textures do not vary with a variation of the deposition parameters. Les couches minces en PTFE sont utilisées depuis peu comme couches d′orientation pour aligner les molécules de cristal liquide. Dans cette contribution, nous étudions d′une part l′influence des paramètres de dépôt (pression, vitesse et température) sur la morphologie des couches observées en utilisant les techniques de microscopie optique et de microscopie à force atomique. De plus, nous avons mesuré l′angle de pretilt induit sur les nématiques par ces films. Cet angle est faible, de l′ordre de 0.3°. Bien que la topographie des couches déposées varie lorsque les paramètres de dépôt changent, les textures du nématique ne changent pas.
ISSN:1058-725X
DOI:10.1080/10587259908026004