Magic number vacancy aggregates in Si and GaAs – structure and positron lifetime studies
We investigate structural properties of large vacancy agglomerates in Si and GaAs using a self-consistent-charge density-functional based tight-binding method. We also calculated the defect-related positron lifetimes. Strong evidence is found for the existence of vacancy aggregates with unusual magi...
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Published in | Physica. B, Condensed matter Vol. 273-274; pp. 501 - 504 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.12.1999
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Subjects | |
Online Access | Get full text |
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Summary: | We investigate structural properties of large vacancy agglomerates in Si and GaAs using a self-consistent-charge density-functional based tight-binding method. We also calculated the defect-related positron lifetimes. Strong evidence is found for the existence of vacancy aggregates with unusual magic numbers in GaAs. In contrast to Si – the first stable agglomerate consists 12 vacancies instead of 6. This findings fit into experimental observations on deformed and irradiated samples. |
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ISSN: | 0921-4526 1873-2135 |
DOI: | 10.1016/S0921-4526(99)00537-2 |