Magic number vacancy aggregates in Si and GaAs – structure and positron lifetime studies

We investigate structural properties of large vacancy agglomerates in Si and GaAs using a self-consistent-charge density-functional based tight-binding method. We also calculated the defect-related positron lifetimes. Strong evidence is found for the existence of vacancy aggregates with unusual magi...

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Bibliographic Details
Published inPhysica. B, Condensed matter Vol. 273-274; pp. 501 - 504
Main Authors Staab, T.E.M., Haugk, M., Sieck, A., Frauenheim, Th, Leipner, H.S.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.12.1999
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Summary:We investigate structural properties of large vacancy agglomerates in Si and GaAs using a self-consistent-charge density-functional based tight-binding method. We also calculated the defect-related positron lifetimes. Strong evidence is found for the existence of vacancy aggregates with unusual magic numbers in GaAs. In contrast to Si – the first stable agglomerate consists 12 vacancies instead of 6. This findings fit into experimental observations on deformed and irradiated samples.
ISSN:0921-4526
1873-2135
DOI:10.1016/S0921-4526(99)00537-2