Guest Editorial: Machine learning applied to quality and security in software systems

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Bibliographic Details
Published inIET software Vol. 17; no. 4; pp. 345 - 347
Main Authors Gao, Honghao, Hussain, Walayat, Durán Barroso, Ramón J., Arshad, Junaid, Yin, Yuyu
Format Journal Article
LanguageEnglish
Published John Wiley & Sons, Inc 01.08.2023
Hindawi-IET
Subjects
Machine learning
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ISSN:1751-8806
1751-8814
DOI:10.1049/sfw2.12141