An empirical method for imaging the short circuit current density in silicon solar cells based on dark lock-in thermography
The most straightforward way to map the photo-induced short circuit current density (Jsc) in solar cells is light beam-induced current (LBIC) mapping. Recently several methods for Jsc imaging based on camera-based photoluminescence and illuminated lock-in thermography imaging were proposed. This let...
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Published in | Solar energy materials and solar cells Vol. 143; pp. 406 - 410 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.12.2015
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Subjects | |
Online Access | Get full text |
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Summary: | The most straightforward way to map the photo-induced short circuit current density (Jsc) in solar cells is light beam-induced current (LBIC) mapping. Recently several methods for Jsc imaging based on camera-based photoluminescence and illuminated lock-in thermography imaging were proposed. This letter reports an alternative method for Jsc imaging, which is solely based on the evaluation of dark lock-in thermography images. This method is particularly advantageous to improve the accuracy of dark lock-in thermography based local efficiency analysis of solar cells.
•PC1D simulations on Si cells are performed for varying bulk lifetime.•The dependence of Jsc on J01 is well-defined.•This dependence can be approximated by a linear+square function.•The fitting parameters A and B allow us to calculate Jsc from J01.•This allows us to derive Jsc images from DLIT images. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0927-0248 1879-3398 |
DOI: | 10.1016/j.solmat.2015.07.027 |