Photoplastic effect in silicon

The influence of illumination (hv=1.17 eV, P=1 W/cm2 on the crystal surface) on the motion of dislocations in silicon is investigated in the temperature range 325°C–422°C using the double etching technique. The screw dislocation and one type of 60° dislocation (30/90 dislocation) exhibit a strong ph...

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Bibliographic Details
Published inPhysica B + C Vol. 116; no. 1-3; pp. 594 - 599
Main Authors Küsters, K.H., Alexander, H.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.01.1983
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Summary:The influence of illumination (hv=1.17 eV, P=1 W/cm2 on the crystal surface) on the motion of dislocations in silicon is investigated in the temperature range 325°C–422°C using the double etching technique. The screw dislocation and one type of 60° dislocation (30/90 dislocation) exhibit a strong photoplastic effect : the activation energy of the 30/90 dislocation is changed by ΔE=0.68 eV. The different behaviour of the two types of 60° dislocations points to recombination enhancement of the dislocation motion in contrast to the effect of a changed charge state.
ISSN:0378-4363
DOI:10.1016/0378-4363(83)90312-1