Brillouin scattering study in the GaN epitaxial layer

We have investigated the elastic properties of a GaN epitaxial layer on a sapphire substrate by Brillouin scattering in the backward and 90° scattering geometries. A sample of high optical quality grown by the two-flow MOCVD method with a complex structure of In 0.05Ga 0.95N(0.05 μm)/GaN(2 μm)/sapph...

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Bibliographic Details
Published inPhysica. B, Condensed matter Vol. 219; pp. 547 - 549
Main Authors Takagi, Y., Ahart, M., Azuhata, T., Sota, T., Suzuki, K., Nakamura, S.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.04.1996
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