Focused Ion Beam (FIB) tomography of nanoindentation damage in nanoscale metal/ceramic multilayers

• Published in: Materials characterization Vol. 61; no. 4; pp. 481 - 488
• Main Authors: Singh, D.R.P., Chawla, N., Shen, Y.-L.
• Format: Journal Article
• Language: English
• Published: New York, NY Elsevier Inc 01.04.2010; Elsevier
• Subjects: 3D Materials Science; Cross-disciplinary physics: materials science; rheology; Damage; Deformation; Exact sciences and technology; Focused Ion Beam (FIB); Materials science; Multilayers; Nanocomposites; Nanoindentation; Nanostructure; Phase diagrams and microstructures developed by solidification and solid-solid phase transformations; Physics; Serial sectioning; Silicon carbide; Solidification; Tomography; Serial sectioning; Focused Ion Beam (FIB); Nanoindentation; 3D Materials Science; Multilayers; Ion beam; Ceramics; Indentation

A 3D FIB tomography approach to characterise and visualise the deformation and damage due to nanoindentation of Al/SiC multilayered composites is presented. This tomography provides a clear and important understanding of deformation processes under indentation loading not possible by conventional 2D...