Focused Ion Beam (FIB) tomography of nanoindentation damage in nanoscale metal/ceramic multilayers

A 3D FIB tomography approach to characterise and visualise the deformation and damage due to nanoindentation of Al/SiC multilayered composites is presented. This tomography provides a clear and important understanding of deformation processes under indentation loading not possible by conventional 2D...

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Bibliographic Details
Published inMaterials characterization Vol. 61; no. 4; pp. 481 - 488
Main Authors Singh, D.R.P., Chawla, N., Shen, Y.-L.
Format Journal Article
LanguageEnglish
Published New York, NY Elsevier Inc 01.04.2010
Elsevier
Subjects
3D Materials Science
Cross-disciplinary physics: materials science; rheology
Damage
Deformation
Exact sciences and technology
Focused Ion Beam (FIB)
Materials science
Multilayers
Nanocomposites
Nanoindentation
Nanostructure
Phase diagrams and microstructures developed by solidification and solid-solid phase transformations
Physics
Serial sectioning
Silicon carbide
Solidification
Tomography
Serial sectioning
Focused Ion Beam (FIB)
Nanoindentation
3D Materials Science
Multilayers
Ion beam
Ceramics
Indentation
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Summary:A 3D FIB tomography approach to characterise and visualise the deformation and damage due to nanoindentation of Al/SiC multilayered composites is presented. This tomography provides a clear and important understanding of deformation processes under indentation loading not possible by conventional 2D approaches.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1044-5803
1873-4189
DOI:10.1016/j.matchar.2010.01.005