Effect of electric field on local structure of PZT single crystal studied by X-ray absorption spectroscopy technique

The aim of this work is to investigate the local structure of PbZr 1 −x Ti x O 3 (PZT) single crystal with x = 0.44 under the application of electric field employing Synchrotron X-ray Absorption Near-Edge Structure (XANES) technique. In this experiment, PZT single crystal was subjected to 0.35 kV/mm...

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Published inIntegrated ferroelectrics Vol. 177; no. 1; pp. 137 - 142
Main Authors Tharamas, Rojnapa, Jutimoosik, Jaru, Bootchanont, Atipong, Kidkhunthod, Pinit, Rujirawat, Saroj, Ye, Zuo-Guang, Yimnirun, Rattikorn
Format Journal Article
LanguageEnglish
Published Philadelphia Taylor & Francis 02.01.2017
Taylor & Francis Ltd
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Summary:The aim of this work is to investigate the local structure of PbZr 1 −x Ti x O 3 (PZT) single crystal with x = 0.44 under the application of electric field employing Synchrotron X-ray Absorption Near-Edge Structure (XANES) technique. In this experiment, PZT single crystal was subjected to 0.35 kV/mm and 0.70 kV/mm electric fields. The Ti K-edge XANES spectra reflect the significant change of the local structure of PZT unit cell before and after static electrical loading. From the XANES results, it was clearly seen that XANES spectral intensity gradually changed when the electrical load was applied. This can be caused by the shift of Ti atoms in the unit cell. The clear agreement between the measured and simulated XANES spectra was the supporting evidence of Ti off-center displacement in the PZT unit cell.
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ISSN:1058-4587
1607-8489
DOI:10.1080/10584587.2017.1285675