Quantitative TOF-SIMS imaging of DNA microarrays produced by bubble jet printing technique and the role of TOF-SIMS in life science industry

• Published in: Applied surface science Vol. 231; pp. 385 - 391
• Main Authors: Hashimoto, Hiroyuki, Nakamura, Kumi, Takase, Hiromitsu, Okamoto, Tadashi, Yamamoto, Nobuko
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.06.2004
• Subjects: Bubble jet printing; DNA microarray; Electron flood gun; Extractor bias voltage; Oligonucleotide probe; Secondary ion yield; DNA microarray; Oligonucleotide probe; Extractor bias voltage; Bubble jet printing; Secondary ion yield; Electron flood gun
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2004.03.106

Visualization of probe DNA molecules, which exist in a printed dot on an insulating substrate, has been realized by TOF-SIMS. Reproducible PO 2 − ions derived from the DNAs have been collected from an area of 300 μm×300 μm by optimizing the measurement conditions. The primary Ga + ions with a dosage of 2×10 12 ions/cm 2 gave approximately 1.4×10 4 counts as PO 2 − for one printed dot in which the numbers of the DNA molecules and the PO x units were calculated as 2.4×10 7 and 9.6×10 8, respectively. These numbers gave 1.5×10 −5 as the secondary ion yield for PO 2 −. The role of TOF-SIMS in life science industry was also discussed.