Dewetting of Unreacted Epoxy/Amine Mixtures on Silica

• Published in: Journal of colloid and interface science Vol. 249; no. 1; pp. 246 - 252
• Main Authors: Woerdeman, Dara L., Parnas, Richard S., Giunta, Rachel K., Wilkerson, Amy L.
• Format: Journal Article
• Language: English
• Published: San Diego, CA Elsevier Inc 01.05.2002; Elsevier
• Subjects: Amines - chemistry; Applied sciences; Composites; Epoxy Compounds - chemistry; Exact sciences and technology; Forms of application and semi-finished materials; Molecular Structure; Polymer industry, paints, wood; Silicon Dioxide - chemistry; Technology of polymers; Wetting; Epoxy resin; Secondary ion mass spectrometry; Dispersion reinforced material; Experimental study; Silica; Composite material; Thin film; Polymer filler interaction; Interface properties; Amine; Curing(plastics); Time of flight method
• ISSN: 0021-9797; 1095-7103
• DOI: 10.1006/jcis.2002.8254

We employ a direct method, time-of-flight secondary ion mass spectroscopy (ToF-SIMS), to determine experimentally the chemical compositions of the wetted and dewetted regions of an uncured epoxy thin film. Determining the composition of the dewetted region indicated the presence of a very thin sublayer of resin in what was thought to be a region devoid of resin. The capability of ToF-SIMS to probe small 65×65 μm 2 areas of the surface has permitted us to directly compare the SIMS spectra of the wetted and dewetted regions to the survey spectra of the reactants. This may indicate the strength of resin/silica interactions, which determine interface formation and properties.