A frequency-domain mixer model for diffusion-cooled hot-electron bolometers

A new frequency domain hot-electron bolometer (HEB) mixer model is described, which takes into account the non-uniform temperature distribution found in superconducting diffusion-cooled devices. In this model the bolometer is discretized into a finite number of segments, and the non-linear large sig...

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Bibliographic Details
Published inIEEE transactions on applied superconductivity Vol. 9; no. 2; pp. 4444 - 4447
Main Authors Skalare, A., McGrath, W.R.
Format Journal Article Conference Proceeding
LanguageEnglish
Published New York, NY IEEE 01.06.1999
Institute of Electrical and Electronics Engineers
Subjects
Astronomical observations
Astronomy
Bolometers
Coupling circuits
Devices
Diffusion
Direct current
Earth, ocean, space
Exact sciences and technology
Far infrared (10-300 μm)
Frequency conversion
Frequency domain analysis
Fundamental astronomy and astrophysics. Instrumentation, techniques, and astronomical observations
Heating
Iterative algorithms
Joining
Local oscillators
Mathematical models
Mixers
Superconducting devices
Superconductivity
Temperature distribution
Temperature distribution
Local oscillator
Astrophysics
Theoretical model
Conversion gain
Hot electrons
Intermediate frequency
Bolometers
Frequency domain method
IV characteristic
Equivalent circuits
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Summary:A new frequency domain hot-electron bolometer (HEB) mixer model is described, which takes into account the non-uniform temperature distribution found in superconducting diffusion-cooled devices. In this model the bolometer is discretized into a finite number of segments, and the non-linear large signal response to local oscillator and DC heating is found by an iterative algorithm. A frequency-domain coupling matrix is introduced to represent small-signal modulations around the large-signal values of temperatures and heat flows inside the device. The coupling matrix and a Norton representation of the mixer DC and intermediate frequency (IF) circuit allows the mixer conversion to be calculated.
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ISSN:1051-8223
1558-2515
DOI:10.1109/77.784011