Atomic force microscopy characterization of ultrafiltration membranes: correspondence between surface pore dimensions and molecular weight cut-off
Atomic force microscopy (AFM) has been used to quantify the mean surface pore diameters of a family of five ultrafiltration membranes with molecular weight cut‐off (MWCO) in the range 1000–10 000 aspect ratio tips were used and the images were treated with fast Fourier transform filtering to remove...
Saved in:
Published in | Surface and interface analysis Vol. 29; no. 8; pp. 544 - 547 |
---|---|
Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Chichester, UK
John Wiley & Sons, Ltd
01.08.2000
Wiley |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Atomic force microscopy (AFM) has been used to quantify the mean surface pore diameters of a family of five ultrafiltration membranes with molecular weight cut‐off (MWCO) in the range 1000–10 000 aspect ratio tips were used and the images were treated with fast Fourier transform filtering to remove distortions. The mean pore diameters were found to be in the range 1.93–3.14 nm, increasing systematically with the MWCO. Mean pore diameters have also been evaluated from the MWCO values using three published expressions relating MWCO to solute radius. Depending on the expression used, the ratio of the mean pore diameters obtained from MWCO data and AFM measurements (Rr) was in the range 1.04–2.42. Agreement between the diameters obtained in the two ways was best for the membranes with the lowest MWCO values. The overall agreement was substantially better than has been reported previously. The good correspondence between mean surface pore dimensions and MWCO demonstrates the usefulness of AFM in quantifying such a key membrane property. Copyright © 2000 John Wiley & Sons, Ltd. |
---|---|
Bibliography: | ark:/67375/WNG-R274GNRB-H PCI Membranes. UK Engineering and Physical Sciences Research Council. istex:A86611EA2B036D968BC9729EF5254D57F7439EC4 ArticleID:SIA901 |
ISSN: | 0142-2421 1096-9918 |
DOI: | 10.1002/1096-9918(200008)29:8<544::AID-SIA901>3.0.CO;2-4 |