Non-resonant X-ray/laser interaction spectroscopy as a method for assessing charge competition, trapping and luminescence efficiency in wide band-gap materials

Using a conventional fast-shuttered laboratory X-ray source in combination with pulsed laser diode modules, the possibilities for undertaking X-ray/laser interaction spectroscopy in wide band-gap luminescent materials are explored. It is shown that in such materials, a variety of X-ray/laser timing...

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Published inJournal of luminescence Vol. 130; no. 8; pp. 1404 - 1414
Main Authors Poolton, N.R.J., Bos, A.J.J., Wallinga, J., de Haas, J.T.M., Dorenbos, P., de Vries, L., Kars, R.H., Jones, G.O., Drozdowski, W.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.08.2010
Elsevier
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Summary:Using a conventional fast-shuttered laboratory X-ray source in combination with pulsed laser diode modules, the possibilities for undertaking X-ray/laser interaction spectroscopy in wide band-gap luminescent materials are explored. It is shown that in such materials, a variety of X-ray/laser timing sequences can extract complimentary information regarding the charge-carrier trapping, de-trapping and recombination processes. The effects on the luminescence are illustrated for six example materials (YPO 4:Ce,Sm, Lu 3Al 5O 12:Pr, Al 2O 3:C, natural sodium feldspar NaAlSi 3O 8, cubic BN and type IIa natural diamond). By ramping the temperature from 10 to 320 K during repeated X-ray pump/laser-probe activation cycles, a rapid assessment can be made of the important thermally dependent changes to the charge carrier trapping competition processes.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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content type line 23
ISSN:0022-2313
1872-7883
DOI:10.1016/j.jlumin.2010.03.002