Self-calibrating evaluation method for microwave interferometry measurements

• Published in: Electronics letters Vol. 49; no. 5; pp. 356 - 358
• Main Authors: Prihoda, M, Hoffmann, K
• Format: Journal Article
• Language: English
• Published: Stevenage The Institution of Engineering and Technology 28.02.2013; Institution of Engineering and Technology
• Subjects: amplitude measurement; Exact sciences and technology; Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; light interferometry; light reflection; microwave interferometry measurement; microwave measurement; Microwave technology; nonelectric quantity measurement; phase measurement; Physics; reflection; self‐calibrating evaluation method; light reflection; microwave measurement; self-calibrating evaluation method; amplitude measurement; reflection; phase measurement; light interferometry; microwave interferometry measurement; nonelectric quantity measurement; Microwave measurement; Microwave interferometer; Selfcalibration; Electromagnetic testing
• ISSN: 0013-5194; 1350-911X; 1350-911X
• DOI: 10.1049/el.2012.3122

Microwave interferometry provides a sensitive measurement of amplitudes and phases of reflections. Basically, the interferometric system can be used to measure a non-electrical quantity, such as distance. Presented is a new method to evaluate data from a microwave interferometer. The method is compared with the previously used procedure. The new method provides more accurate results and also offers the possibility of self-calibration.