PZT and PT screen-printed thick films

• Published in: Journal of the European Ceramic Society Vol. 21; no. 10; pp. 1441 - 1444
• Main Authors: Simon, L., Le Dren, S., Gonnard, P.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Oxford Elsevier Ltd 2001; Elsevier
• Subjects: Applied sciences; Building materials. Ceramics. Glasses; Ceramic industries; Chemical industry and chemicals; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Cross-disciplinary physics: materials science; rheology; Dielectric, piezoelectric, ferroelectric and antiferroelectric materials; Dielectrics, piezoelectrics, and ferroelectrics and their properties; Electrotechnical and electronic ceramics; Exact sciences and technology; Grain size; Materials science; Materials synthesis; materials processing; Methods of materials synthesis and materials processing; Niobates, titanates, tantalates, pzt ceramics, etc; Physics; Piezoelectric properties; PZT; Technical ceramics; Grain size; Piezoelectric properties; PZT; Films; PT; Elastic constant; Lead titanates; Grain size distribution; Oxide ceramics; Lead zirconates; Powder; Inorganic compound; Substrate; Silver; Wet process; Quaternary compound; Thick film; Transition metal compounds; Sintering; Preparation; Plane wave; Porosity; Alumina; Coprecipitation; Electroceramics
• ISSN: 0955-2219; 1873-619X
• DOI: 10.1016/S0955-2219(01)00037-1

Thick films (40–80 μm) of modified lead zirconate titanate (PZT) and lead titanate (PT) are screen-printed on alumina substrates electroded with Ag–Pd. First the influence of the powder grain size distribution on film characteristics after sintering is studied. With regard to the powder preparation, two processes are used: a mixed-oxide method and a wet coprecipitation process. Then thick films characteristics are compared with bulk ceramics ones. Two main factors explain the observed differences: residual porosity of the film and lateral clamping effect of the substrate. Other piezoelectric and elastic films coefficients are estimated from a plane wave model.