Simple technique for integrating compact silicon devices within optical fibers
In this work, we present a simple fabrication process enabling the integration of a subwavelength amorphous silicon layer inside optical fibers by means of the arc discharge technique. To assess our method, we have fabricated a compact in-line Fabry-Perot interferometer consisting of a thin (<1 ...
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Published in | Optics letters Vol. 39; no. 4; p. 861 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
15.02.2014
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Online Access | Get more information |
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Summary: | In this work, we present a simple fabrication process enabling the integration of a subwavelength amorphous silicon layer inside optical fibers by means of the arc discharge technique. To assess our method, we have fabricated a compact in-line Fabry-Perot interferometer consisting of a thin (<1 μm) a-Si:H layer completely embedded within a standard single-mode optical fiber. The device exhibits low loss (1.3 dB) and high interference fringe visibility (~80%) both in reflection and transmission, due to the high refractive index contrast between silica and a-Si:H. A high linear temperature sensitivity up to 106 pm/°C is demonstrated in the range 120°C-400°C. The proposed interferometer is attractive for point monitoring applications as well as for ultrahigh-temperature sensing in harsh environments. |
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ISSN: | 1539-4794 |
DOI: | 10.1364/OL.39.000861 |