Ultrahigh vacuum magnetic force microscopy: domain imaging on in situ grown Fe(1 0 0) thin films
The design of an ultrahigh vacuum (UHV) magnetic force microscope (MFM) is described. The instrument was applied to investigate the magnetic structure of 10–80 nm thick Fe(1 0 0) films grown in situ in UHV on Ag(1 0 0) thin film substrates. The domain structure consists mainly of 90° domain walls wh...
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Published in | Journal of magnetism and magnetic materials Vol. 190; no. 1; pp. 124 - 129 |
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Main Authors | , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.12.1998
Elsevier Science |
Subjects | |
Online Access | Get full text |
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Summary: | The design of an ultrahigh vacuum (UHV) magnetic force microscope (MFM) is described. The instrument was applied to investigate the magnetic structure of 10–80
nm thick Fe(1
0
0) films grown in situ in UHV on Ag(1
0
0) thin film substrates. The domain structure consists mainly of 90° domain walls while only a minority of 180° walls was found. The wall profiles are found to be of Néel type for 10 nm films and of asymmetric Bloch type for 80 nm films. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0304-8853 |
DOI: | 10.1016/S0304-8853(98)00269-8 |