Simulation of gain stability of THGEM gas-avalanche particle detectors

Charging-up processes affecting gain stability in Thick Gas Electron Multipliers (THGEM) were studied with a dedicated simulation toolkit. Integrated with Garfield++, it provides an effective platform for systematic phenomenological studies of charging-up processes in MPGD detectors. We describe the...

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Published inJournal of instrumentation Vol. 13; no. 1; p. P01015
Main Authors Correia, P.M.M., Pitt, M., Azevedo, C.D.R., Breskin, A., Bressler, S., Oliveira, C.A.B., Silva, A.L.M., Veenhof, R., Veloso, J.F.C.A.
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.01.2018
Subjects
Algorithms
Charging
Computer simulation
Electric potential
Electrodes
Photomultiplier tubes
Physical properties
Radiation counters
Sensors
Simulation
Stability
Voltage
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Summary:Charging-up processes affecting gain stability in Thick Gas Electron Multipliers (THGEM) were studied with a dedicated simulation toolkit. Integrated with Garfield++, it provides an effective platform for systematic phenomenological studies of charging-up processes in MPGD detectors. We describe the simulation tool and the fine-tuning of the step-size required for the algorithm convergence, in relation to physical parameters. Simulation results of gain stability over time in THGEM detectors are presented, exploring the role of electrode-thickness and applied voltage on its evolution. The results show that the total amount of irradiated charge through electrode's hole needed for reaching gain stabilization is in the range of tens to hundreds of pC, depending on the detector geometry and operational voltage. These results are in agreement with experimental observations presented previously.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/13/01/P01015