In situ study by synchrotron X-ray diffraction of the motion of basal stacking faults during the reverse-phase transformation of a Cu–Zn–Al single crystal
The reverse 9R→β transformation of a Cu–Zn–Al single crystal is followed ‘in situ’ by synchrotron X-ray topography and X-ray diffraction. From the modifications of the diffraction spots observed in Laue diagrams near the transition temperature, the motion and the elimination of basal stacking faults...
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Published in | Materials science & engineering. A, Structural materials : properties, microstructure and processing Vol. 266; no. 1; pp. 191 - 197 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
30.06.1999
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | The reverse 9R→β transformation of a Cu–Zn–Al single crystal is followed ‘in situ’ by synchrotron X-ray topography and X-ray diffraction. From the modifications of the diffraction spots observed in Laue diagrams near the transition temperature, the motion and the elimination of basal stacking faults is described. This structural evolution of the crystal in the martensitic phase can be considered as a precursor stage to the 9R→β transformation. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0921-5093 1873-4936 |
DOI: | 10.1016/S0921-5093(99)00015-5 |