In situ study by synchrotron X-ray diffraction of the motion of basal stacking faults during the reverse-phase transformation of a Cu–Zn–Al single crystal

• Published in: Materials science & engineering. A, Structural materials : properties, microstructure and processing Vol. 266; no. 1; pp. 191 - 197
• Main Authors: Jourdan, C., Gastaldi, J., Baronnet, A., Belkahla, S., Guénin, G.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 30.06.1999; Elsevier
• Subjects: Applied sciences; Basal stacking faults; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Defects and impurities in crystals; microstructure; Exact sciences and technology; Martensitic transformations; Materials science; Metals. Metallurgy; Phase diagrams and microstructures developed by solidification and solid-solid phase transformations; Physics; Shape memory alloy; Stacking faults and other planar or extended defects; Structure of solids and liquids; crystallography; X-ray diffraction; Shape memory alloy; X-ray diffraction; Basal stacking faults; Stacking faults; Phase transformations; In situ; Martensitic transformations; Ternary alloys; XRD; Experimental study; Shape memory effects; Zinc alloys; Crystal defect motion; Aluminium alloys; Copper alloys; X-ray topography; Transition element alloys
• ISSN: 0921-5093; 1873-4936
• DOI: 10.1016/S0921-5093(99)00015-5

The reverse 9R→β transformation of a Cu–Zn–Al single crystal is followed ‘in situ’ by synchrotron X-ray topography and X-ray diffraction. From the modifications of the diffraction spots observed in Laue diagrams near the transition temperature, the motion and the elimination of basal stacking faults is described. This structural evolution of the crystal in the martensitic phase can be considered as a precursor stage to the 9R→β transformation.