Effect of bending and tension on the voltage–current relation of Bi-2223/Ag

The critical current in a strained HTS tape degrades due to filament cracking. Here, the voltage–current characteristics of bent and tensioned Bi-2223/Ag tapes have been measured. In the case of tension the voltage characteristics were also measured over different sections of the sample to obtain lo...

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Bibliographic Details
Published inPhysica. C, Superconductivity Vol. 401; no. 1; pp. 241 - 245
Main Authors Ahoranta, Maria, Lehtonen, Jorma, Kováč, Pavol, Hušek, Imrich, Melišek, Tibor
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.01.2004
Subjects
Bending
Bi-2223/Ag
Tension
V( I)-curve
Bending
Bi-2223/Ag
Tension
85.25.Kx
74.60.Jg
V( I)-curve
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Summary:The critical current in a strained HTS tape degrades due to filament cracking. Here, the voltage–current characteristics of bent and tensioned Bi-2223/Ag tapes have been measured. In the case of tension the voltage characteristics were also measured over different sections of the sample to obtain local curves. Because the crack formation is stochastic the influence of stress on the distribution of the critical current along the tape length is studied with statistical methods. Attention is paid on the effect of different stress distribution caused by bending and tension. Because the local properties cannot be uniquely determined from the measured voltage–current characteristics the limits of applicability for these models are discussed. In the analysis emphasis is put on the dynamic n-value.
ISSN:0921-4534
1873-2143
DOI:10.1016/j.physc.2003.09.046