Comparison between field reliability and new prediction methodology on avionics embedded electronics

This paper presents a critical analysis of a deterministic reliability prediction approach previously described. Moreover, the proposed methodology is applied to an avionics embedded electronics equipment and the results are compared to field return data. A very good accordance between these predict...

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Bibliographic Details
Published inMicroelectronics and reliability Vol. 38; no. 6; pp. 1171 - 1175
Main Authors Charpenel, P., Cavernes, P., Casanovas, V., Borowski, J., Chopin, J.M.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Oxford Elsevier Ltd 01.06.1998
Elsevier
Subjects
Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
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Summary:This paper presents a critical analysis of a deterministic reliability prediction approach previously described. Moreover, the proposed methodology is applied to an avionics embedded electronics equipment and the results are compared to field return data. A very good accordance between these predictive reliability data and field data is shown. The limitations of this methodology are analyzed.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0026-2714
1872-941X
DOI:10.1016/S0026-2714(98)00077-8