Structural characterization of self-assembled monolayers by unenhanced Raman spectroscopy

This paper presents unenhanced Raman spectra of self‐assembled monolayers [2‐(22‐trichlorosilanyldocosoxy)ethyl acetate], grafted on to silicon dioxide wafers, obtained by using a confocal Raman microscope. The quality of monolayer formation, at the micrometer scale, was monitored by drawing maps of...

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Bibliographic Details
Published inJournal of Raman spectroscopy Vol. 34; no. 11; pp. 902 - 906
Main Authors Choplin, F., Navarre, S., Bousbaa, J., Babin, P., Bennetau, B., Bruneel, J.-L., Desbat, B.
Format Journal Article
LanguageEnglish
Published Chichester, UK John Wiley & Sons, Ltd 01.11.2003
Subjects
chlorosilane compounds
Cleaning
Confocal
mapping
Micrometers
Monolayers
Raman spectroscopy
Self-assembled monolayers
silicon wafers
unenhanced Raman scattering
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Summary:This paper presents unenhanced Raman spectra of self‐assembled monolayers [2‐(22‐trichlorosilanyldocosoxy)ethyl acetate], grafted on to silicon dioxide wafers, obtained by using a confocal Raman microscope. The quality of monolayer formation, at the micrometer scale, was monitored by drawing maps of a few square micrometers and homogeneous monolayers were obtained using a detergent cleaning procedure. The results are in good agreement with those obtained previously by atomic force microscopy studies. Copyright © 2003 John Wiley & Sons, Ltd.
Bibliography:ark:/67375/WNG-11BFTH26-2
ArticleID:JRS1073
istex:A37F1C74A1175E0ACC7FEF1D59DBF323728EF34C
CNRS.
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0377-0486
1097-4555
DOI:10.1002/jrs.1073