Surface structure of size exclusion chromatography stationary phase

• Published in: Journal of microscopy (Oxford) Vol. 227; no. 2; pp. 110 - 117
• Main Authors: KALE, A., CHERYAN, M., ROBINSON, S., MACLAREN, S.
• Format: Journal Article
• Language: English
• Published: Oxford, UK Blackwell Publishing Ltd 01.08.2007
• Subjects: AFM; chromatography; SEM; specimen preparation; wet swollen stationary phase
• ISSN: 0022-2720; 1365-2818
• DOI: 10.1111/j.1365-2818.2007.01802.x

Summary Chromatography is a widely used separation unit operation for separating nanomaterials such as proteins and enzymes, quantum dots and carbon nanotubes. An understanding of the chromatographic stationary phase on a nanoscale would be extremely helpful in improving the process and developing efficient and new materials. This study is an attempt to characterize the stationary phase in its swollen wet state using environmental scanning electron microscope (ESEM) and atomic force microscopy (AFM). Observation of the wet beads using ESEM is limited to a micron‐range resolution. However, AFM can be used in wet mode to characterize the stationary phase in both wet and dry states with nanometric resolution. In the swollen state, microscale cracks were observed on the surface and this may explain the high mass transfer rate and lower back pressures of the stationary phase. The structures on the surface of the stationary phase depict that the micron‐sized beads may be composed of nanometric beads.