Design and construction of a new chamber for measuring the thickness of alpha-particle sources

The thickness of charged-particle emitting sources can be determined by varying the incidence angle of particles using silicon semiconductor detectors. The differences in energy between the peaks for an alpha emission measured with different incident angles are due to the energy loss of alpha partic...

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Bibliographic Details
Published inApplied radiation and isotopes Vol. 66; no. 6; pp. 804 - 807
Main Authors Martín Sánchez, A., Jurado Vargas, M., Nuevo Sánchez, M.J., Fernández Timón, A.
Format Journal Article
LanguageEnglish
Published England Elsevier Ltd 01.06.2008
Subjects
Alpha-particle spectrometry
Nuclear instrumentation
Source thickness
Nuclear instrumentation
Source thickness
Alpha-particle spectrometry
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Summary:The thickness of charged-particle emitting sources can be determined by varying the incidence angle of particles using silicon semiconductor detectors. The differences in energy between the peaks for an alpha emission measured with different incident angles are due to the energy loss of alpha particles in the source. These shifts can thus be used to estimate the source thickness. A new detection chamber has been constructed for this purpose. Its advantage is the registration of the alpha particles emitted from a given source using up to three different detectors simultaneously. Monte Carlo simulation was used to help to determine the best measurement conditions and interpret the results.
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ISSN:0969-8043
1872-9800
DOI:10.1016/j.apradiso.2008.02.054