Quick extended x-ray absorption fine structure instrument with millisecond time scale, optimized for in situ applications

• Published in: Review of scientific instruments Vol. 81; no. 1; p. 015105
• Main Authors: Khalid, S, Caliebe, W, Siddons, P, So, I, Clay, B, Lenhard, T, Hanson, J, Wang, Q, Frenkel, A I, Marinkovic, N, Hould, N, Ginder-Vogel, M, Landrot, G L, Sparks, D L, Ganjoo, A
• Format: Journal Article
• Language: English
• Published: United States 01.01.2010
• ISSN: 1089-7623
• DOI: 10.1063/1.3276679

In order to learn about in situ structural changes in materials at subseconds time scale, we have further refined the techniques of quick extended x-ray absorption fine structure (QEXAFS) and quick x-ray absorption near edge structure (XANES) spectroscopies at beamline X18B at the National Synchrotron Light Source. The channel cut Si (111) monochromator oscillation is driven through a tangential arm at 5 Hz, using a cam, dc motor, pulley, and belt system. The rubber belt between the motor and the cam damps the mechanical noise. EXAFS scan taken in 100 ms is comparable to standard data. The angle and the angular range of the monochromator can be changed to collect a full EXAFS or XANES spectrum in the energy range 4.7-40.0 KeV. The data are recorded in ascending and descending order of energy, on the fly, without any loss of beam time. The QEXAFS mechanical system is outside the vacuum system, and therefore changing the mode of operation from conventional to QEXAFS takes only a few minutes. This instrument allows the acquisition of time resolved data in a variety of systems relevant to electrochemical, photochemical, catalytic, materials, and environmental sciences.