Application of heterogeneous nano-semiconductors for photocatalytic advanced oxidation of organic compounds: A review

[Display omitted] •Reviewing semiconductors and their physical types.•Reviewing parameters effecting photocatalytic process.•Discussions on doping and different methods of doping.•Reviewing methods for immobilization of semiconductors.•A detailed study on degradation of hazardous materials exist in...

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Bibliographic Details
Published inJournal of environmental chemical engineering Vol. 7; no. 5; p. 103283
Main Authors Akerdi, Abdollah Gholami, Bahrami, S. Hajir
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.10.2019
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Summary:[Display omitted] •Reviewing semiconductors and their physical types.•Reviewing parameters effecting photocatalytic process.•Discussions on doping and different methods of doping.•Reviewing methods for immobilization of semiconductors.•A detailed study on degradation of hazardous materials exist in wastewater from different industries. Advanced oxidation processes (AOPs) introduce a hopeful technology for the removal of water polluted with hard degradable organic compounds. Today, one of the main effective AOP technologies to degrade these hazardous organics is via the photocatalytic process. The present review focuses on the recent progress in the fixed-bed and immobilized nanophotocatalysts and also their applications for resolving the environmental concerns. Various organics elimination using a variety of photocatalysts and innovative reactors are discussed. This critical review summarizes the recent progress in the synthesis and modification (physical and chemical) of semiconductors. Furthermore, different ways of photocatalysts immobilization are explained in details. By considering different dangerous chemicals present in wastewater and different industries, catalytic methods used by researchers to degrade these organic compounds are reviewed. In addition, the degradation pathway of some organics through the catalytic operation is described.
ISSN:2213-3437
2213-3437
DOI:10.1016/j.jece.2019.103283