Angular and NiFe thickness dependence of exchange bias in IrMn/NiFe/IrMn thin film
Exchange biased IrMn/NiFe/IrMn thin films were studied as a function of NiFe thickness. In plane angular dependence of a resonance field distribution which is measured by FMR was analyzed as a combined effect of an unidirectional anisotropy and an uniaxial anisotropy. The unidirectional anisotropic...
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Published in | Journal of magnetism and magnetic materials Vol. 303; no. 2; pp. e188 - e191 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.08.2006
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Subjects | |
Online Access | Get full text |
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Summary: | Exchange biased IrMn/NiFe/IrMn thin films were studied as a function of NiFe thickness. In plane angular dependence of a resonance field distribution which is measured by FMR was analyzed as a combined effect of an unidirectional anisotropy and an uniaxial anisotropy. The unidirectional anisotropic field and the uniaxial anisotropic field were linearly varied with NiFe thickness while the films with a thicker NiFe layer do not follow the linear variation. Resonance field and linewidth variations were also analysed with NiFe thickness. |
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ISSN: | 0304-8853 |
DOI: | 10.1016/j.jmmm.2006.01.051 |