Angular and NiFe thickness dependence of exchange bias in IrMn/NiFe/IrMn thin film

Exchange biased IrMn/NiFe/IrMn thin films were studied as a function of NiFe thickness. In plane angular dependence of a resonance field distribution which is measured by FMR was analyzed as a combined effect of an unidirectional anisotropy and an uniaxial anisotropy. The unidirectional anisotropic...

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Published inJournal of magnetism and magnetic materials Vol. 303; no. 2; pp. e188 - e191
Main Authors Yoo, Yong-Goo, Min, Seong-Gi, Ryu, Ho-Jun, Park, Nam-Seok, Yu, Seong-Cho
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.08.2006
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Summary:Exchange biased IrMn/NiFe/IrMn thin films were studied as a function of NiFe thickness. In plane angular dependence of a resonance field distribution which is measured by FMR was analyzed as a combined effect of an unidirectional anisotropy and an uniaxial anisotropy. The unidirectional anisotropic field and the uniaxial anisotropic field were linearly varied with NiFe thickness while the films with a thicker NiFe layer do not follow the linear variation. Resonance field and linewidth variations were also analysed with NiFe thickness.
ISSN:0304-8853
DOI:10.1016/j.jmmm.2006.01.051