Investigation of the electron-backscattering process from Ru(0 0 0 1) and Ag(0 0 1) surfaces

• Published in: Applied surface science Vol. 177; no. 1; pp. 42 - 47
• Main Authors: Czyżewski, Jerzy J, Kaszczyszyn, Stanisław, Krajniak, Janusz
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.06.2001; Elsevier Science
• Subjects: Applied sciences; Auger electron spectroscopy; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Elastic backscattering electron; Electron and ion emission by liquids and solids; impact phenomena; Electron impact: secondary emission; Exact sciences and technology; Impact phenomena (including electron spectra and sputtering); Metals. Metallurgy; Physics; Ruthenium; Secondary electron emission; Silver; Silver; Ruthenium; Ru; Ag; Elastic backscattering electron; Auger electron spectroscopy; Secondary electron emission; Electron backscattering; Transition elements; Surfaces; Experimental study; AES
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/S0169-4332(01)00181-7

The 37 eV Auger electron yield and the secondary electron emission intensity from a Ru(0 0 0 1)-face in a take-off direction of 42.30°, both related to the generation factor which includes the contribution of the primary current and the backscattering fraction, have been measured as a function of the primary electron energy, E p. A standard sample of a Ag(0 0 1) surface has been used to measure the elastically backscattered electron (EBE) intensity to be able to compare the results obtained by means of the CMA analyser with the theoretical and the experimental ones presented by Jablonski et al. given in RFA analyser geometry. Furthermore, the EBE intensity has been measured from the Ru(0 0 0 1) surface.