High resolution transmission electron microscopic observation of β-Sn thin films

• Published in: Thin solid films Vol. 142; no. 1; pp. 101 - 112
• Main Authors: Eyring, L., Dufner, D.C.
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 15.08.1986; Elsevier Science
• Subjects: Analysing. Testing. Standards; Applied sciences; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Materials science; Measurement of properties and materials state; Metals, semimetals and alloys; Metals. Metallurgy; Nondestructive testing; Physical properties of thin films, nonelectronic; Physics; Specific materials; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Resolving power; Transmission electron microscopy; Diffraction pattern; Experimental study; Layer thickness; Thin film; Grain boundary
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/0040-6090(86)90306-8

Thin films of β-Sn were studied by high resolution transmission electron microscopy (HRTEM). Diffraction patterns and experimental images agreed with those calculated on the basis of the known crystal structure of β-Sn. By matching the observed images to those calculated, the thicknesses of the films were estimated. Defects were observed as illustrated by a high resolution image of a [100] tilt grain boundary ( Σ = 13, θ = 27°). The 20 nm thick films were found to be covered by a carbonaceous deposit. The presence of small clusters of β-Sn in the amorphous contamination layers covering the films was also revealed by HRTEM and by their conversion into SnO 2 particles in the electron beam.