Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

A novel approach to dynamic SEE ADC testing is presented. The benefits of this test scheme versus prior implemented techniques include the ability to observe ADC SEE errors that are in the form of phase shifts, single bit upsets, bursts of disrupted signal composition, and device clock loss.

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 57; no. 4; pp. 1958 - 1965
Main Authors Berg, M D, Buchner, S P, Hak Kim, Friendlich, M, Perez, C, Phan, A M, Seidleck, C M, Label, K A, Kruckmeyer, K
Format Journal Article
LanguageEnglish
Published New York IEEE 01.08.2010
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
ADC
Bursts
Clocks
Devices
Digital
dynamic
Dynamics
Errors
Field programmable gate arrays
FPGA
Instruments
NASA
Observability
Phase shift
Radiation effects
SEE
Signatures
Single event upset
Testing
Vehicle dynamics
Vehicles
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Summary:A novel approach to dynamic SEE ADC testing is presented. The benefits of this test scheme versus prior implemented techniques include the ability to observe ADC SEE errors that are in the form of phase shifts, single bit upsets, bursts of disrupted signal composition, and device clock loss.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2010.2052068