Visualizing graphene edges using tip-enhanced Raman spectroscopy

The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate determination of the phase-breaking lengths (Lσ) near the edges remains to be a significant challenge for near field optical measurements. This artic...

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Published inJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Vol. 31; no. 4
Main Authors Su, Weitao, Roy, Debdulal
Format Journal Article
LanguageEnglish
Published 01.07.2013
Subjects
glass
silver
graphene
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Abstract The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate determination of the phase-breaking lengths (Lσ) near the edges remains to be a significant challenge for near field optical measurements. This article presents an image of graphene edges using high resolution tip-enhanced Raman spectroscopy (TERS) of mechanically exfoliated SLG and reports the value of Lσ (4.2 ± 0.5 nm). The current near-field measurements verify the theoretical value of Lσ and highlight the potential of TERS in characterizing graphene at the nanoscale.
AbstractList The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate determination of the phase-breaking lengths (Lσ) near the edges remains to be a significant challenge for near field optical measurements. This article presents an image of graphene edges using high resolution tip-enhanced Raman spectroscopy (TERS) of mechanically exfoliated SLG and reports the value of Lσ (4.2 ± 0.5 nm). The current near-field measurements verify the theoretical value of Lσ and highlight the potential of TERS in characterizing graphene at the nanoscale.
The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate determination of the phase-breaking lengths (Lσ) near the edges remains to be a significant challenge for near field optical measurements. This article presents an image of graphene edges using high resolution tip-enhanced Raman spectroscopy (TERS) of mechanically exfoliated SLG and reports the value of Lσ (4.2 ± 0.5 nm). The current near-field measurements verify the theoretical value of Lσ and highlight the potential of TERS in characterizing graphene at the nanoscale.
Author Roy, Debdulal
Su, Weitao
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  givenname: Debdulal
  surname: Roy
  fullname: Roy, Debdulal
  email: Debdulal.Roy@npl.co.uk
  organization: National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, United Kingdom
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silver
graphene
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Snippet The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate...
The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate...
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Title Visualizing graphene edges using tip-enhanced Raman spectroscopy
URI http://dx.doi.org/10.1116/1.4813848
Volume 31
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