Visualizing graphene edges using tip-enhanced Raman spectroscopy

The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate determination of the phase-breaking lengths (Lσ) near the edges remains to be a significant challenge for near field optical measurements. This artic...

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Bibliographic Details
Published inJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Vol. 31; no. 4
Main Authors Su, Weitao, Roy, Debdulal
Format Journal Article
LanguageEnglish
Published 01.07.2013
Subjects
glass
silver
graphene
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Summary:The edges of a single layer graphene (SLG) flake play important roles in determining the electronic transport properties of graphene devices. Accurate determination of the phase-breaking lengths (Lσ) near the edges remains to be a significant challenge for near field optical measurements. This article presents an image of graphene edges using high resolution tip-enhanced Raman spectroscopy (TERS) of mechanically exfoliated SLG and reports the value of Lσ (4.2 ± 0.5 nm). The current near-field measurements verify the theoretical value of Lσ and highlight the potential of TERS in characterizing graphene at the nanoscale.
ISSN:2166-2746
1520-8567
2166-2754
DOI:10.1116/1.4813848