Current directions in automatic test-pattern generation

• Published in: Computer (Long Beach, Calif.) Vol. 32; no. 11; pp. 58 - 64
• Main Authors: Kwang-Ting Cheng, Krstic, A.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.11.1999; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithms; Automatic test pattern generation; Automatic testing; Automation; Categories; Computer industry; DC generators; Debugging; Design automation; Design engineering; Design for testability; Faults; Handles; Information technology; Mathematical models; Pattern generation; Power generation; Scalability; Test pattern generators; Time measurements; Timing

Test development automation tools, which automate dozens of tasks essential for developing adequate tests, generally fall into four categories: design for testability (DFT), test pattern generation, pattern-grading, and test program development and debugging. The focus in the article is on automatic...