Electron spin resonance-scanning tunneling microscopy

• Published in: Advances in physics Vol. 61; no. 2; pp. 117 - 152
• Main Authors: Balatsky, Alexander V., Nishijima, Mitsuaki, Manassen, Yishay
• Format: Journal Article
• Language: English
• Published: Abingdon Taylor & Francis 01.04.2012; Taylor & Francis Ltd
• Subjects: electron spin resonance; Electrons; Exact sciences and technology; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Magnetism; Microscopy; Noise; Physics; Resonance; rf signal; Scanning probe microscopes, components and techniques; Scanning tunneling microscopes; scanning tunneling microscopy; single spin detection; Solid state physics; spectroscopy; spin precession; Scanning tunneling microscopy; Reviews; Electron paramagnetic resonance; Background noise; Electron spin; Tunnel effect
• ISSN: 0001-8732; 1460-6976
• DOI: 10.1080/00018732.2012.668775

Electron spin resonance-scanning tunneling microscopy (ESR-STM) is a rapidly developing surface-science technique that is sensitive to a single spin existing on or nearby a solid surface. The single spin is detected through elevated noise at the Larmor frequency that appears when the single spin participates in the tunneling process between the tip and the surface. In this review, experimental and theoretical works which have been performed up to date on ESR-STM are reviewed. The remaining experimental problems which have to be solved, possible approaches to differentiate between different mechanisms and the future of ESR-STM are discussed.\ PACS: 72.25.Dc Spin polarized transport in semiconductors, 72.70.+m Noise processes and phenomena, 73.20.Hb Impurity and defect levels; energy states of adsorbed species, 73.40.Gk Tunneling, 75.70.Rf Surface magnetism, 75.76.+j Spin transport effects, 76.30.-v Electron paramagnetic resonance and relaxation, 78.47.-p Spectroscopy of solid state dynamics