Low-Temperature Sintering of Bi(Ni0.5Ti0.5)O3-BiFeO3-Pb(Zr0.5Ti0.5)O3 Ceramics and Their Performance
A low-temperature sintering strategy was realized for preparing 0.21Bi(Ni0.5Ti0.5)O3-0.05BiFeO3-0.74Pb(Zr0.5Ti0.5)O3 (0.21BNT-0.05BF-0.74PZT) ceramics by conventional ceramic processing by adding low melting point BiFeO3 and additional sintering aid LiBO2. Pure perovskite 0.21BNT-0.05BF-0.74PZT cera...
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Published in | Materials Vol. 16; no. 9; p. 3459 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
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MDPI AG
28.04.2023
MDPI |
Subjects | |
Online Access | Get full text |
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Summary: | A low-temperature sintering strategy was realized for preparing 0.21Bi(Ni0.5Ti0.5)O3-0.05BiFeO3-0.74Pb(Zr0.5Ti0.5)O3 (0.21BNT-0.05BF-0.74PZT) ceramics by conventional ceramic processing by adding low melting point BiFeO3 and additional sintering aid LiBO2. Pure perovskite 0.21BNT-0.05BF-0.74PZT ceramics are prepared at relatively low sintering temperatures, and their structure presents tetragonal distortion that is affected slightly by the sintering temperature. The 1030 °C sintered samples have high densification accompanied by relatively large grains. All ceramics have excellent dielectric performance with a relatively high temperature of dielectric constant maximum, and present an apparent relaxation characteristic. A narrow sintering temperature range exists in the 0.21BNT-0.05BF-0.74PZT system, and the 1030 °C sintered 0.21BNT-0.05BF-0.74PZT ceramics exhibit overall excellent electrical performance. The high-temperature conductivity can be attributed to the oxygen vacancies’ conduction produced by the evaporation of Pb and Bi during sintering revealed by energy dispersive X-ray measurement. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 1996-1944 1996-1944 |
DOI: | 10.3390/ma16093459 |