Investigation into X-point emissivity in metallic materials for temperature measurement

• Published in: Case studies in thermal engineering Vol. 57; p. 104371
• Main Authors: Wang, Gangquan, Bai, Yinxue, Yan, Naiya, Li, Longfei, Zhang, Kaihua, Zhao, Baolin, Liu, Yufang, Yu, Kun
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.05.2024; Elsevier
• Subjects: Lorentz-Drude model; Numerical analysis; Temperature measurement; X-point emissivity; Temperature measurement; Numerical analysis; Lorentz-Drude model; X-point emissivity
• ISSN: 2214-157X; 2214-157X
• DOI: 10.1016/j.csite.2024.104371

Amidst the swift progression of thermal radiation, the application of high-temperature spectral radiation characteristics in metallic materials has become pervasive across domains such as temperature measurement and material identification. X-Point is the intersection of the metal emissivity isotherms. The scope of X-point emissivity has been inadequately explored in prior investigations. The present study employs a concerted approach that amalgamates the simulation of the Lorentz-Drude model theory and the emissivity measurement based on the energy contrast method, to comprehensively investigate the X-point emissivity of metal materials. The results demonstrate that: (1) the simulation of X-point emissivity is achieved for the first time by the incorporation of the Lorentz-Drude model of electron-phonon scattering. (2) Validation of the model's feasibility is demonstrated by the measurement of the X-point emissivity of tungsten, and the inaugural measurement of vanadium's X-point emissivity. (3) Pioneeringly, X-point emissivity finds application in metal temperature measurement, exhibiting an accuracy 0.3 % superior to that of pyrometers. This research establishes an effective methodology for the model simulation of metal X-point emissivity and its application in radiation temperature measurement scenarios.