Fast detection of precipitates and oxides on CdZnTe surfaces by spectroscopic ellipsometry

We study the surface chemistry of Cd0.96Zn0.04Te(211)B by X-ray photoelectron spectroscopy and ellipsometry. We obtain first the dielectric functions of amorphous Te and Cd on Cd0.96Zn0.04Te(211)B by in-situ ellipsometry after growing thin films of each material by molecular beam epitaxy. We then st...

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Published inJournal of electronic materials Vol. 36; no. 8; pp. 1077 - 1084
Main Authors BADANO, G, MILLION, A, CANAVA, B, TRAN-VAN, P, ETCHEBERRY, A
Format Conference Proceeding Journal Article
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 01.08.2007
Springer Nature B.V
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Summary:We study the surface chemistry of Cd0.96Zn0.04Te(211)B by X-ray photoelectron spectroscopy and ellipsometry. We obtain first the dielectric functions of amorphous Te and Cd on Cd0.96Zn0.04Te(211)B by in-situ ellipsometry after growing thin films of each material by molecular beam epitaxy. We then study their oxidation in air and show that Cd oxidizes primarily as a hydroxide whereas Te is present as TeO2. In neither case is the oxidation of the films complete, as a substantial amount of either metallic Te or Cd remains even after several days of oxidation. We subsequently exploit an electroless chemical etchant based on Ce to produce Te-rich Cd0.96Zn0.04Te(211)B surfaces which oxidize very little in air. Another etchant containing KCN reduces the amount of alpha-Te substantially. Finally, we construct a tentative optical model for the Cd0.96Zn0.04Te(211)B surface that yields the abundance of amorphous Te on the surface.
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ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-007-0176-7