Fast detection of precipitates and oxides on CdZnTe surfaces by spectroscopic ellipsometry
We study the surface chemistry of Cd0.96Zn0.04Te(211)B by X-ray photoelectron spectroscopy and ellipsometry. We obtain first the dielectric functions of amorphous Te and Cd on Cd0.96Zn0.04Te(211)B by in-situ ellipsometry after growing thin films of each material by molecular beam epitaxy. We then st...
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Published in | Journal of electronic materials Vol. 36; no. 8; pp. 1077 - 1084 |
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Main Authors | , , , , |
Format | Conference Proceeding Journal Article |
Language | English |
Published |
New York, NY
Institute of Electrical and Electronics Engineers
01.08.2007
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | We study the surface chemistry of Cd0.96Zn0.04Te(211)B by X-ray photoelectron spectroscopy and ellipsometry. We obtain first the dielectric functions of amorphous Te and Cd on Cd0.96Zn0.04Te(211)B by in-situ ellipsometry after growing thin films of each material by molecular beam epitaxy. We then study their oxidation in air and show that Cd oxidizes primarily as a hydroxide whereas Te is present as TeO2. In neither case is the oxidation of the films complete, as a substantial amount of either metallic Te or Cd remains even after several days of oxidation. We subsequently exploit an electroless chemical etchant based on Ce to produce Te-rich Cd0.96Zn0.04Te(211)B surfaces which oxidize very little in air. Another etchant containing KCN reduces the amount of alpha-Te substantially. Finally, we construct a tentative optical model for the Cd0.96Zn0.04Te(211)B surface that yields the abundance of amorphous Te on the surface. |
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Bibliography: | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 |
ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-007-0176-7 |