Comparison at the sub-100 fW optical power level of calibrating a single-photon detector using a high-sensitive, low-noise silicon photodiode and the double attenuator technique

• Published in: Metrologia Vol. 53; no. 4; pp. 1115 - 1122
• Main Authors: Porrovecchio, G, Šmid, M, López, M, Hofer, H, Rodiek, B, Kück, S
• Format: Journal Article
• Language: English
• Published: IOP Publishing 01.08.2016
• Subjects: calibration; comparison; detection efficiency; Si-SPAD
• ISSN: 0026-1394; 1681-7575
• DOI: 10.1088/0026-1394/53/4/1115

A comparison down to sub-100-fW optical power level was carried out between a low-noise Silicon photodiode and a low optical flux measurement facility based on a double attenuator technique. The comparison was carried out via a silicon single-photon avalanche diode (Si-SPAD), which acted as transfer standard. The measurements were performed at a wavelength of 770 nm using an attenuated laser as a radiation source at optical power levels between approximately 86 fW and approximately 1325 fW, corresponding to approximately 330 000 photons s−1 and approximately 5.2  ×  106 photons s−1, respectively. The mean relative deviation of the detection efficiencies of the Si-SPAD, determined by the Si-photodiode and the low optical flux measurement facility, i.e. between two completely independent traceability routes, was  <  0.2%, thus well within the combined standard uncertainty of the two measurements. To our knowledge, this is the first comparison for the detection efficiency of a single photon detector using a direct optical flux measurement by a conventional Si-photodiode at such low power levels.