Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress

Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under el...

Full description

Saved in:
Bibliographic Details
Published inApplied sciences Vol. 11; no. 16; p. 7627
Main Authors Lee, Gyeong Won, Choi, Yoonsuk, Kim, Heejin, Park, Jongwoo, Shim, Jong-In, Shin, Dong-Soo
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 01.08.2021
Subjects
Carrier recombination
charge recombination and transport
Chemical reactions
Degradation
Efficiency
Electron transport
Fluorescence
Glass substrates
Light emitting diodes
Organic light emitting diodes
Recombination
Stress
transient
Trends
Online AccessGet full text

Cover

More Information
Summary:Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.
ISSN:2076-3417
2076-3417
DOI:10.3390/app11167627