Optical and thermoluminescence properties of Lu2Si2O7：Pr single crystal

Single crystal of Lu2Si2OT：Pr was grown by Czochralski method. Transmittance, photoluminescence excitation （PLE） and photo- luminescence （PL） spectra, X-ray excited luminescence （XEL） and fluorescence decay time spectra of the sample were measured and dis- cussed to investigate its optical character...

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Bibliographic Details
Published inJournal of rare earths Vol. 30; no. 8; pp. 775 - 779
Main Author 冯鹤 任国浩 吴云涛 徐军 杨秋红 谢建军 周明奇 陈晨龙
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.08.2012
Subjects
Decay
Excitation spectra
Luminescence
optical properties
Photoluminescence
Pr3+ doped lutetium pyrosilicate
Rare earth metals
rare earths
scintillation
single crystal
Single crystals
Spectra
thermally stimulated luminescence
Three dimensional
X-射线
光学特性
光致发光
单晶
提拉法生长
晶体结构
热释光
荧光衰减
thermally stimulated luminescence
scintillation
optical properties
Pr3+ doped lutetium pyrosilicate
single crystal
rare earths
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ISSN1002-0721
2509-4963
DOI10.1016/S1002-0721(12)60128-8

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Summary:Single crystal of Lu2Si2OT：Pr was grown by Czochralski method. Transmittance, photoluminescence excitation （PLE） and photo- luminescence （PL） spectra, X-ray excited luminescence （XEL） and fluorescence decay time spectra of the sample were measured and dis- cussed to investigate its optical characteristics. The crystal structure of the as grown Lu2Si207：Pr was confirmed to be C2/m. There was a broad absorption peaking at 245 um in the region from 200-260 urn. The PL spectntm was dominated by fast 3py~3Hj band peaking at 524 nm. The XEL spectrum was dominated by the fast 5d14t~---~41e emission peaking at 265 nm. The 2D （temperature-intensity） and 3D （tem- perature-wavelength-intensity） thermally stimulated luminescence （TSL） spectra were measured. The Pr3＋ ion was found to be the recombina- tion center during the TSL process. Three obvious traps were detected in LPS：Pr single crystal with energy depth at 1.06, 0.78 and 0.67 eV.
Bibliography:11-2788/TF
Single crystal of Lu2Si2OT：Pr was grown by Czochralski method. Transmittance, photoluminescence excitation （PLE） and photo- luminescence （PL） spectra, X-ray excited luminescence （XEL） and fluorescence decay time spectra of the sample were measured and dis- cussed to investigate its optical characteristics. The crystal structure of the as grown Lu2Si207：Pr was confirmed to be C2/m. There was a broad absorption peaking at 245 um in the region from 200-260 urn. The PL spectntm was dominated by fast 3py~3Hj band peaking at 524 nm. The XEL spectrum was dominated by the fast 5d14t~---~41e emission peaking at 265 nm. The 2D （temperature-intensity） and 3D （tem- perature-wavelength-intensity） thermally stimulated luminescence （TSL） spectra were measured. The Pr3＋ ion was found to be the recombina- tion center during the TSL process. Three obvious traps were detected in LPS：Pr single crystal with energy depth at 1.06, 0.78 and 0.67 eV.
Pr3＋ doped lutetium pyrosilicate; single crystal; scintillation; optical properties; thermally stimulated luminescence; rare earths
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ISSN:1002-0721
2509-4963
DOI:10.1016/S1002-0721(12)60128-8